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Home Products About Us SEMICON Japan 日本語サイト Product list 　>　Semiconductors and Electronic Materials 　>　Resistivity Processor Sheet Resistivity Measuring Instruments Pre-Process of Semiconductors and Liquid Crystal (Inspection) High quality tool for professionals ! Using the 4-point probe method, this device ensures precise measurement of the sheet resistance of metallic thin film as well as semiconductor materials like a solar battery silicon with easy & simple operation. For the following product inspections 1) Processes from silicon to wafer manufacturing 2) Liquid crystal panels (LCD) manufacturing 3) Manufacturing process of wide range of electric conductivity elements. Optional 4-Point Probe is needed for the measurement. 【Related Product】4-Point Probe ■ Model sigma-5+ It ensures a precise measurement of the resistivity of silicon wafers and other relative materials. We also offer you handy type probes of sillicon for solar panels. Sigma-5+ is a high-end resistivity measuring instrument and the reason of the high performance is based on our 20 years+ experience of resistivity measuring. You will be able to get and evaluate the accurate sheet resistivity and resistivity rate in product line. Also, you can use it for the R&D and inspection process of semiconductor subtrate and conductive thin film subtrate. * Sigma-5+ and sample stage in the photo. [Specification] [Features] - Detailed test available through intelligent control panel - Desktop size desing - With wide range of measurement - Automatic exchange of polarity of electricity - Automatic reset-zero adjustment - Automatic range selection - Sample thickness adjustment - Average value output and printout - Special function - correction of temperature (for silicon) - Temperature input correction factor - Interface for the data printer - Interface for data transfer (RS232C) - Stages available: RG-5, RG-12, RGE-12 sigma5+.pdf ■ Handy-type Sheet resistance & Resistivity meters SRM-232 Sheet Resistance Meters are low-cost hand-held sheet resistance testing systems that include a meter and a four-point probe for use in measuring the sheet resistance of applied coatings such as conductive paints, EMI coatings, ITO on glass, etc. We also available PV-628 for the resistivity of the Si wafers, such as solar cells foundation. Each device enables you to output data to computers, and power source has the auto power-off function. ■ Handy-type Resistivity meter Model PV-628 MODEL PV-628 is a handy-type measuring instrument using 4-point probe method and is designed only for silicon of solar power generation. You can use it without considering the shape and size of the object. It's a portable device which works with battery cells.

首页 制品 公司简介 English 日本語サイト 产品一覧 　>　半导体・电子材料相关　>　激光干涉仪 激光干涉仪 半导体・液晶 前置作业检查 半导体・液晶 作业后的检查 作为EXCEL PRECISION（EXCEL PRECISION，USA）在日本的经销商，我们代理激光干涉仪设备， 结合使用稳定塞曼效应和光学外差探测/信号处理器的双频He - Ne激光系统，可以测量0.3纳米的最小读数分辨率的高度准确和可靠的测量，并且还可以实现低成本系统。 EXCEL PRECISION有限公司作为独立设计和製造的激光干涉测量仪器的行业中建立了自己的地位。 我们在全球拥有超过5000台以上的实绩。 我们不仅製造标准正规产品，依客户的要求接受订製的系统。 第三选择。 EXCEL PRECISION公司的激光干涉仪 您的机器。 会发出怪声音吗？ 如果您有EXCEL PRECISION以司的激光干涉仪，您可以检查纳米级别的精度。 ■1100B 6元素校正系统 1100 B激光校正系统主要用于机械的质量管理。 一次最多可以检测到5个元素，并且检测后形成表格化。 ■1550角度感测器 1550A角度感测器可以测量表面和Z驱动部件的微小位移，不会受到颜色和反射率的影响。

It is a needle for electrical characteristics inspection made with optimum alloy of noble metal type mainly composed of palladium, as the contact material for current application. It has the same mechanical characteristics as tungsten and has superior electrical characteristics to beryllium copper, so stable contact is Home Products About Us SEMICON Japan 日本語サイト Product list 　>　Semiconductors and Electronic Materials 　>　Probe Needle Probe Needle Post-Process of Semiconductors and Liquid Crystal (Inspection) It is a needle for electrical characteristics inspection made with optimum alloy of noble metal type mainly composed of palladium, as the contact material for current application. It has the same mechanical characteristics as tungsten and has superior electrical characteristics to beryllium copper, so stable contact is obtained. More than ten kinds of thickness are prepared between 0.2 mm and 0.7 mm. In addition, osmium alloy for LED, usually needle for tungsten and tungsten carbide material for semiconductor electrode. Especially the standard stock tungsten needle is very recommended at low price. 【Related products】Jig tool for Microwave Testing ・ Micro Positioner ■ P needle (palladium alloy needle) P needle is precision machined in Japan using Paliney 7 as a material. Paliney 7 is excellent in low wear resistance, low contact resistance and high durability. It has been used as an electrode material for more than 50 years, and it is used in many fields due to its material properties. Paliney 7 is an electrode material conforming to ASTM B 540. Containing metal (approx.): Palladium (35%) Silver (30%) Gold (10%) Platinum (10%) Copper (14%) others (1%) Individual resistivity: 30 μΩcm- Conductivity: 5.5 (% l ACS) Knoop hardness: 350-410 Melting temperature: 1015 ° C ■ T-4 needle (for submicron) T-4 needle was manufactured for general probing. Since the whisker needle for the pico probe is used, the submicron hole on the SiO2 opened by the laser cutter can also be attached without damage of the circuit. A shaft part of φ 0.5 mm can be bent by hand and it can be used by processing it into an arbitrary shape. We offer one set of 5 bottles at an affordable price. ■ Push-up pin We are manufacturing push-up pins for parts such as IC chips with tungsten carbide and piano wire at low price. Material: tungsten carbide, stainless steel, piano wire etc. We polish various materials uniformly and offer high quality pins. It can also be used for cutting small parts.

Home Products About Us SEMICON Japan 日本語サイト Company Profile Contact Please feel free to contact us for technical consultation, model selection, specifications etc. Phone: +81-3-3684-2548 / E-Mail: sales@nps-i.co.jp Outline Enlarged View (Google Maps) 5 minutes walk from JR Kameido Station 15 minutes walk from Toei Shinjuku LIne Nishi-Ojima Station Business items (main handled products) 1. 4-point probes and related devices for resistivity measuring instruments such as semiconductors and thin film layers 2. Sheet resistivity measuring instrument for semiconductor, liquid crystal thin film 3. High-performance probe for characterization of semiconductor IC (ULSI, VLSI, etc.) 4. Measurement probe and measurement device for microwave 5. Slide products for measurement, experimental, manual and electric linear/rotating type 6. Probe needle, scrape point 7. Laser interferometer system Management policy We select high-tech equipments and materials indispensable for the advancement of industrial technology in our country widely from domestic and overseas, and provide customers those equipments and information. In addition, we listen to customers' opinions and requests to contribute to the development of industry. As a partner, we carefully see the world trend, so that we help our customers' business more efficiently and achieve cost cutting. We promote consistent management with the motto "We will deliver better products at a lower price with an earlier delivery date". We define our value as the contribution to the development of our customers. President Hayato Nakamura

首頁 製品 公司簡介 English 日本語サイト 產品一覧 　>　半導體・電子材料相關　>　雷射干涉儀 雷射干涉儀 半導體・液晶 前置作業檢查 半導体・液晶 作業後的檢查 作為EXCEL PRECISION（EXCEL PRECISION，USA）在日本的經銷商，我們代理電射干涉儀設備， 結合使用穩定塞曼效應和光學外差探測/信號處理器的雙頻He - Ne雷射系統，可以測量0.3納米的最小讀數分辨率的高度準確和可靠的測量，並且還可以實現低成本系統。EXCEL PRECISION有限公司作為獨立設計和製造的雷射干涉測量儀器的行業中建立了自己的地位。 我們在全球擁有超過5000台以上的實績。 我們不僅製造標準正規產品，依客戶的要求接受訂製的系統。第三選擇。EXCEL PRECISION公司的雷射干涉儀 您的機器。 會發出怪聲音嗎？ 如果您有EXCEL PRECISION以司的雷射干涉儀，您可以檢查納米級別的精度。 ■1100B 6元素校正系統 1100 B雷射校正系統主要用於機械的質量管理。 一次最多可以檢測到5個元素，並且檢測後形成表格化。 ■1550角度感測器 1550A角度感測器可以測量表面和Z驅動部件的微小位移，不會受到顏色和反射率的影響。

It is a micromotion positioning device that enables high precision positioning by micrometer driven type. A dedicated adapter is installed so that Picoprobe design and manufactured by  GGB Industries,Inc(US) can be installed. 首页 产品 公司简介 English 日本語サイト 产品阵容 > 半导体·电子材料相关 > 微定位器 微定位器 半導体・液晶 作業後的檢查 微动定位装置采用千分尺驱动结构，可实现高精度定位。配备专用适配器，可安装美国GGB公司生产的Pico探针。MODEL800系列是专为Pico探针设计的高性能微探针定位器（操纵器）。通过实用新型定位机构与三轴一体化微定位方式，可实现高精度探测。 【相关产品】IC用Pico探针 ·微波用Pico探针 ■ Model 800M Series ■ Model 800V Series MODEL800.pdf

Home Products About Us SEMICON Japan 日本語サイト Four point probe Are you having problems with your 4- point probe? NPS can solve that problem for you! In this article, we will focus on the four-point probe. A standard instrument in use for over 40 years. The four-point probe was developed by A&M FELL of the UK in the 1960s as an electrode for measuring the resistivity of semiconductor materials. Later, the company was acquired by Kulick & Soffer, a major U.S. manufacturer of semiconductor equipment, which took notice of its performance and began selling it, and it became a tool widely used worldwide. In Japan, NPS (formerly known as Nakamura Precision Shokai) started selling the product in 1971, and introduced it to semiconductor manufacturers and equipment manufacturers. At that time, it was still difficult to find a simple and stable way to measure the resistivity of silicon wafers, and engineers quickly recognized the FELL probe as an important tool to solve the problem of semiconductor resistivity measurement, along with the development of measuring instruments. After repeated prototyping until the completion of the FELL probe, we established a design concept that predicted the next several decades and a theoretical structure that enabled high-precision measurement, and succeeded in creating a four-pronged probe that could be used with today's diversified objects to be measured. Later, the patented FELL probe became a worldwide standard instrument used by semiconductor and device manufacturers. (There was an episode where the engineers who were involved in the development of the probe created a separate company to market the probe because it was so good even at the prototype level, but in the end, the difference in performance and durability was so great that it could not be used as an industrial tool. Unlike a four-terminal probe, which simply has four needles, a four-prong probe is a high-performance probe created by "the science and technology of semiconductor contact. For example, the internal spring that pressurizes the needle (patented part) was determined from dozens of prototypes, and is a specification that has a basis in performance. For the mechanical part, we adopted the classic ruby guide for needle movement technique, which was the only cutting-edge watchmaking technology at that time 50 years ago, to pursue the accuracy of the hand guide. (Ruby sliding is still used in some of our FELL type probes, but for the sake of accuracy control and functionality, we use parts made with new materials and manufacturing technology for new probes.) For the needle part in particular, which comes into contact with the object to be measured, the tip structure is formed to correspond to the type of object to be measured, taking into consideration the physical and electrical elements. These technical considerations greatly affect the measurement accuracy, durability, measurement capability, and so on. In the 1970s, NPS President Hayato Nakamura spent a long period of time training at A&M FELL's factory in England to learn the manufacturing technology and know-how of four-point probes, and the technology he inherited directly from the engineers at that time is utilized in the current four-point probes. Nakamura@NPS

首頁 製品 公司簡介 English 日本語サイト 產品一覧 　>　半導體・電子材料相關　>　IC接觸探頭 IC接觸探頭 半導体・液晶 作業後的檢查 0.65毫米，1.27毫米，2.54毫米間距用於IC檢測的其他接觸式探頭，其它例如SOP，SSOP等。它安裝在IC測試處理機上並用。 它耐用，可以低運行成本使用。 電極（針）材質在鈹銅上鍍金。 除此之外，也可製作鈀合金，鎢製造。