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Since the SC series coaxial probe needle is terminated at the SMA connector, it can be used in a high frequency band. The tungsten needle terminal for the signal line is processed to 5μR and it is easy to attach the microscopic part. You can select the specification with the ground with an option. Home Products About Us SEMICON Japan 日本語サイト Product list 　>　Semiconductors and Electronic Materials 　>　50Ω Coaxial Probe 50Ω Coaxial Probe Post-Process of Semiconductors and Liquid Crystal (Inspection) Microwave Measurement Since the SC series coaxial probe needle is terminated at the SMA connector, it can be used in a high frequency band. The tungsten needle terminal for the signal line is processed to 5μR and it is easy to attach the microscopic part. You can select the specification with the ground with an option. 【Related products】Jig tool for Microwave Testing ・ Micro Positioner

We prepare material for capillary used as IC bonding tool. The material is tungsten carbide. We also accept custom made capillary production on request. We can also produce assemblies such as ceramic, nozzle using TC material, wire guide etc. It is also used for coating carbide nozzles and pickup tools. Home Products About Us SEMICON Japan 日本語サイト Product list 　>　Semiconductors and Electronic Materials 　>　Capillary Blank Capillary Blank Other Products We prepare material for capillary used as IC bonding tool. The material is tungsten carbide. We also accept custom made capillary production on request. We can also produce assemblies such as ceramic, nozzle using TC material, wire guide etc. It is also used for coating carbide nozzles and pickup tools. L = 12 mm Dia = 1.58 mm d 1 = 1.0 mm

首页 制品 公司简介 English 日本語サイト 产品一覧 半导体・电子材料相关 半导体・液晶 前置作业检查 电阻率测量仪 P/N决定器 四点探针探测器 激光干涉仪 ※前后作业的检查 半导体・液晶 作业后的检查 IC用的示波器探针 微定位器 50Ω同轴探头 IC接触探头 探针

弊社へのアクセス 所在地　　　　〒136-0071 東京都江東区亀戸６丁目１２−４

Home Products About Us SEMICON Japan 日本語サイト Product list 　>　Semiconductors and Electronic Materials 　>　Picoprobe for IC Post-Process of Semiconductors and Liquid Crystal (Inspection) Picoprobe for IC By using the Picoprobe (design and manufactured by GGB Industries,Inc. ) for IC, the internal voltage of the IC can be measured accurately.Picoprobe is for IC voltage measurement which keeps the stray capacitance value of the probe itself to the utmost limit and further bring the impedance close to the infinite value. This minimizes the load on the measuring device and enables measurement to be performed faithfully. Not only Models 35 which is the world's fastest FET probe, but also we prepare many other models corresponding to each measurement mode. Picoprobe is a worldwide standard instrument as a tool for analytical measurement in integrated circuit design field.We will also correspond with adapters etc. so that they can be used with probers of each manufacturer. 【Related Products】Jig tool for Microwave Testing ・ Micro Positioners [Function comparison table for Picoprobe (FET probe)]

在庫処分セール品一覧 弊社在庫品に限り特別価格にて提供致します。 ※在庫がなくなり次第終了となります。 【Velmex社製スライダー】 ・U4005GM　 ¥40,000　残数1 ・U4005GGMO ¥54,000　残数1 ・A6009K1　 ¥40,000　残数1 ・B9012K1　 ¥64,000　残数1 ・A1506Q1-NM ¥20,000　残数2 ・A4007TS ￥28,000　残数1 ・B2904K1-SP　 ¥24,000　残数1 【GGB社製ピコプローブチップ】 ・18C-1-10 　　　¥12,811 残数8 ・18C-1-20 SOLD ・18C-1-50 SOLD ・18C-2-10 SOLD ・18C-2-20 SOLD ・12C-1-35 SOLD ・12C-2-60 SOLD ・12C-4-10HV 　 ¥4,826 残数3 ・12C-4-125 SOLD ・T-7-35 SOLD ・T-7-60-2uR SOLD ・T-7-175-R-200 　 ¥3,063 残数1 ・T-7-175-2-R-8mm ¥3,090 残数5 ・T-7-175-L-200 　 ¥2,978 残数3 ・10-5K-125-Pd-2-R-500 SOLD ・10-50T-10-W-1 SOLD ・10-50T-175-W-2-L-500 SOLD ・10-250-125-Pd-2-R-500 SOLD ・10-500-125-Pd-2R-500 SOLD ・10-500-175-W-2-R-280 SOLD ・10-50/30-60-W-2-R-250 SOLD ・10-50/30-60-W-2-L-250 SOLD ・10-25/30-60-W-2-R-1000(1.2mm) SOLD ・10-2.5K-125-W-1 SOLD ・10-2.5K-125-W-2-R-200 SOLD ・10-2.5K-125-W-2-R-100 SOLD ・10-2.5K-125-W-2-R-150 SOLD ・10-47/30-125-BeCu-2-S-L-250 SOLD 【4 探針プローブヘッド （旧型）】 ・JS-TC-100-100g　 単価¥40,000　残数1　厚い金属膜向け ・JS-TC-100-200g 　単価¥40,000　残数2　厚い金属膜向け ・JS-TC-600-.635　 単価¥40,000　残数1　　ITO向け ・JS-TC-600-200g　 単価¥40,000　残数2　　ITO向け ・JS-TC-600-100g　 単価¥40,000　残数5　　ITO向け ・JS-TC-400-.635-100g　単価¥40,000　残数3　薄膜向け 【精密プローブ針】

首页 制品 公司简介 English 日本語サイト 产品一覧 　>　半导体・电子材料相关　>　四点探针探测器 四点探针探测器 [NPS Version] 半导体・液晶 前置作业检查 它是用于测量电阻率的高精度探头。 目前，直流四点探针法是测量导电材料电阻值最可靠的方法。 许多测量工程师认定测量中使用的探头的机械性能极大地影响了测量的准确性。 特别是在测量半导体材料时，会出现精度和耐久性问题。 拥有多年经验和良好记录的NPS 四点探针在全球被公认为高精度探头，并被测量仪器製造商用作标准探头。针部分使用耐用的金属在金属和远端的低导体电阻, 和 NPS 自己的 "Microedge 接触 " 处理 (IP, MT, 某人, 通过执行 EP 等), 保证了多种不同样品的稳定测量。 (日本国内组装产品、调整和售后产品) NPS 是40年来的探针专家, 另外还为探頭、探针修復和测试以及其他公司所做的其他探头提供技术谘询。 (对于 Napson, 其他测量仪器) <主要功能> 高精度·高耐久性·世界标准装备·低价格·短期维修再生（FELL型）从针尖到连接器的连续连接，通过专利的板迭板式弹簧，专用针规格， 採购，装配，性能管理 【相关产品】电阻率测量仪 ■ 四点探针探测器 构成四点探针的每个部件都是由专用加工机器的开发和生产製造的，从製造到出货的品质控制都是由专职技术人员进行，由此可以提供具有高精度和高耐用性产品 。 此外，为了满足国内用户的要求，我们制定了自己的规格并进行组装。我们还提供各种四点探针的维修或改装服务。如果您想了解更多信息，请随时与我们联系。 ■ 轻小型探测器 这是一个手持式测量的四点探针。 它可以用于硅铁锭等。 ■ 0.1mm间隔 MODEL SEP-4是一个四点探针，用于测量针距为0.1 mm间距的薄层电阻。 由于四根针之间的距离小至0.3mm（线性），因此电场能量的影响范围很小，并且即使在面积为5×5mm的小面积的焊盘的情况下，电阻测量也不受电场电力的影响。 可安装并固定在我们的微型定位器800MRF上。 尖端材料 钨(W)，铍铜(BeCu) 尖端形状 扁平(F)，圆形(R) 针距0.1mm（总距离0.3mm）0.3mm（总距离0.6mm）。 0.3mm(总距离0.6mm)引出线60cm香蕉插头等可选装。

首页 产品 公司简介 English 日本語サイト 产品阵容 > 半导体·电子材料相关 > 微波用Pico探针 微波用Pico探针（射频探针） 微波测量 美国GGB公司生产的微波用Pico探针（RF探针）是采用GGB公司独创的连续式同轴结构（已获专利）的微波器件测试探针，兼具低损耗与高耐久性。此外，其多触点探针可与直流探针组合使用，通过电容器与电阻的混合结构（已获专利）实现了发射等低损耗测量。 　该高频探针深受追求严苛测量数据的技术人员青睐。 　板簧式接地片结构与边缘接触方式实现了低接触电阻与优异的测量重复性，同时可定制镍材质针尖。此外，100μm以下间距规格及车载电子设备用大电流探针等定制需求亦可垂询。 产品兼具低损耗、高复现性与高耐久性，通过专利同轴结构与专利旁路电容方案等技术确保卓越性能。 【相关产品】微波测试治具·微定位器 [特点] ■坚固结构与高性能 　Pico探针的信号部分采用从连接器到针尖的连续同轴结构。这种连续同轴结构具有卓越的信号传输特性，能够将信号可靠地传输至峰值频率范围。此外，接触中的针尖不易受外部振动引起的共振影响，其结构设计在针尖接触时的过载情况下也具有极强的抗性。 ■多样化探针款式 　为适配平面基板、封装件等各类样品形态的测量需求，Pico探针提供多种款式选择。 ■便捷的针尖定位 　与被测物接触的接地针尖采用弹簧结构，通过与固定信号线针尖及接地针部保持恒定间隙，可依据该间隙进行精准定位，确保接触始终稳定。 ■点接触设计 　Pico探针针尖采用点接触结构，确保稳定接触。该设计能有效排斥被测物氧化层，实现良好接触，同时显著降低接触时产生的位置偏差误差，保障测量精度。 微波用Pico探针功能对比表

Home Products About Us SEMICON Japan 日本語サイト We have participated in SEMICON Japan which is a comprehensive exhibition of semiconductor manufacturing and inspection equipment from the first time. We appriciate for our customers who have taken care of us for many years. We have also participated in an exhibision "Microwave Exhibition" speciallized in microwave technology. SEMICON JAPAN ■ SEMICON JAPAN 1977 The first meeting was held at Dome Hall of Harumi Exhibition Hall. Exhibitors at the time Astec Co., Ltd. / Advantest Corporation / Applied Materials Japan Co., Ltd. / Ando Electric Co., Ltd. / Westbond Company / SDC Semicon Technology Co., Ltd. / Kanematsu Device Co., Ltd. / Complete Electronics / Canon Sales Co., Ltd. / Saint-Gobain Norton Corporation / Shipley · Far East Co., Ltd. / Japan Speedfam Co., Ltd. / Dainichisei Corporation / Disco / Dainippon Screen Mfg. Co., Ltd. / Tempronics Corporation / Tokyo Electron Co., Ltd. / Japan AERA Co., Ltd. / Japan AD Inc. / Japanese SMS Co., Ltd. / Japan MKS Corporation / Japan Swagelok Corporation / Nippon Micronics Co., Ltd. / Nomura Micro Science Co., Ltd. / Hakuto Co., Ltd. / Hitachi Kokusai Electric / Hitachi High-Technologies Corporation / Fujimi Incorporated / Fluoroware · Valkar Japan Co., Ltd. ■ Latest appearance It is our booth at SEMICON JAPAN held at Tokyo Big Sight. Microwave Exhibition It is our booth at Microwave Exhibition held at Pacifico Yokohama.

首頁 製品 公司簡介 English 日本語サイト 產品一覧 　>　半導體・電子材料相關　>　四點探針 四點探針探測器 [NPS Version] 半導體・液晶 前置作業檢查 它是用於測量電阻率的高精度探頭。 目前，直流四點探針法是測量導電材料電阻值最可靠的方法。 許多測量工程師認定測量中使用的探頭的機械性能極大地影響了測量的準確性。 特別是在測量半導體材料時，會出現精度和耐久性問題。 擁有多年經驗和良好記錄的NPS 四點探針在全球被公認為高精度探頭，並被測量儀器製造商用作標準探頭。針部分使用耐用的金屬在金屬和遠端的低導體電阻, 和 NPS 自己的 "Microedge 接觸 " 處理 (IP, MT, 某人, 通過執行 EP 等), 保證了多種不同樣品的穩定測量。 (日本國內組裝產品、調整和售後產品) NPS 是40年來的探針專家, 另外還為探頭、探針修復和測試以及其他公司所做的其他探針提供技術諮詢。 (對於 Napson, 其他測量儀器) <主要功能> 高精度·高耐久性·世界標準裝備·低價格·短期維修再生（FELL型）從針尖到連接器的連續連接，通過專利的板叠板式弹簧，專用針規格， 採購，裝配，性能管理 【相關產品】電阻率測量儀 ■ 四點探針探測器 構成四點探針的每個部件都是由專用加工機器的開發和生產製造的，從製造到出貨的品質控制都是由專職技術人員進行，由此可以提供具有高精度和高耐用性產品 。 此外，為了滿足國內用戶的要求，我們制定了自己的規格並進行組裝。此外，我们还可以灵活应对各种厂家的4点探针的维修和定制（部件更换和大修）要求。 请随时与我们联系以获取更多信息。 ■ 袖珍型探測器 這是一個手持式測量的四點探針。它可以用於矽鐵錠等 ■ 0.1mm間隔 MODEL SEP-4是一個四點探針，用於測量針距為0.1 mm間距的薄層電阻。 由於四根針之間的距離小至0.3mm（線性），因此電場能量的影響範圍很小，並且即使在面積為5×5mm的小面積的焊盤的情況下，電阻測量也不受電場電力的影響。

It is a micromotion positioning device that enables high precision positioning by micrometer driven type. A dedicated adapter is installed so that Picoprobe design and manufactured by  GGB Industries,Inc(US) can be installed. 首页 产品 公司简介 English 日本語サイト 产品阵容 > 半导体·电子材料相关 > 微定位器 微定位器 半導体・液晶 作業後的檢查 微动定位装置采用千分尺驱动结构，可实现高精度定位。配备专用适配器，可安装美国GGB公司生产的Pico探针。MODEL800系列是专为Pico探针设计的高性能微探针定位器（操纵器）。通过实用新型定位机构与三轴一体化微定位方式，可实现高精度探测。 【相关产品】IC用Pico探针 ·微波用Pico探针 ■ Model 800M Series ■ Model 800V Series MODEL800.pdf

Home Products About Us SEMICON Japan 日本語サイト Four point probe Are you having problems with your 4- point probe? NPS can solve that problem for you! In this article, we will focus on the four-point probe. A standard instrument in use for over 40 years. The four-point probe was developed by A&M FELL of the UK in the 1960s as an electrode for measuring the resistivity of semiconductor materials. Later, the company was acquired by Kulick & Soffer, a major U.S. manufacturer of semiconductor equipment, which took notice of its performance and began selling it, and it became a tool widely used worldwide. In Japan, NPS (formerly known as Nakamura Precision Shokai) started selling the product in 1971, and introduced it to semiconductor manufacturers and equipment manufacturers. At that time, it was still difficult to find a simple and stable way to measure the resistivity of silicon wafers, and engineers quickly recognized the FELL probe as an important tool to solve the problem of semiconductor resistivity measurement, along with the development of measuring instruments. After repeated prototyping until the completion of the FELL probe, we established a design concept that predicted the next several decades and a theoretical structure that enabled high-precision measurement, and succeeded in creating a four-pronged probe that could be used with today's diversified objects to be measured. Later, the patented FELL probe became a worldwide standard instrument used by semiconductor and device manufacturers. (There was an episode where the engineers who were involved in the development of the probe created a separate company to market the probe because it was so good even at the prototype level, but in the end, the difference in performance and durability was so great that it could not be used as an industrial tool. Unlike a four-terminal probe, which simply has four needles, a four-prong probe is a high-performance probe created by "the science and technology of semiconductor contact. For example, the internal spring that pressurizes the needle (patented part) was determined from dozens of prototypes, and is a specification that has a basis in performance. For the mechanical part, we adopted the classic ruby guide for needle movement technique, which was the only cutting-edge watchmaking technology at that time 50 years ago, to pursue the accuracy of the hand guide. (Ruby sliding is still used in some of our FELL type probes, but for the sake of accuracy control and functionality, we use parts made with new materials and manufacturing technology for new probes.) For the needle part in particular, which comes into contact with the object to be measured, the tip structure is formed to correspond to the type of object to be measured, taking into consideration the physical and electrical elements. These technical considerations greatly affect the measurement accuracy, durability, measurement capability, and so on. In the 1970s, NPS President Hayato Nakamura spent a long period of time training at A&M FELL's factory in England to learn the manufacturing technology and know-how of four-point probes, and the technology he inherited directly from the engineers at that time is utilized in the current four-point probes. Nakamura@NPS