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在庫処分セール品一覧 弊社在庫品に限り特別価格にて提供致します。 ※在庫がなくなり次第終了となります。 【Velmex社製スライダー】 ・U4005GM　 ¥40,000　残数1 ・U4005GGMO ¥54,000　残数1 ・A6009K1　 ¥40,000　残数1 ・B9012K1　 ¥64,000　残数1 ・A1506Q1-NM ¥20,000　残数2 ・A4007TS ￥28,000　残数1 ・B2904K1-SP　 ¥24,000　残数1 【GGB社製ピコプローブチップ】 ・18C-1-10 　　　¥12,811 残数8 ・18C-1-20 SOLD ・18C-1-50 SOLD ・18C-2-10 SOLD ・18C-2-20 SOLD ・12C-1-35 SOLD ・12C-2-60 SOLD ・12C-4-10HV 　 ¥4,826 残数3 ・12C-4-125 SOLD ・T-7-35 SOLD ・T-7-60-2uR SOLD ・T-7-175-R-200 　 ¥3,063 残数1 ・T-7-175-2-R-8mm ¥3,090 残数5 ・T-7-175-L-200 　 ¥2,978 残数3 ・10-5K-125-Pd-2-R-500 SOLD ・10-50T-10-W-1 SOLD ・10-50T-175-W-2-L-500 SOLD ・10-250-125-Pd-2-R-500 SOLD ・10-500-125-Pd-2R-500 SOLD ・10-500-175-W-2-R-280 SOLD ・10-50/30-60-W-2-R-250 SOLD ・10-50/30-60-W-2-L-250 SOLD ・10-25/30-60-W-2-R-1000(1.2mm) SOLD ・10-2.5K-125-W-1 SOLD ・10-2.5K-125-W-2-R-200 SOLD ・10-2.5K-125-W-2-R-100 SOLD ・10-2.5K-125-W-2-R-150 SOLD ・10-47/30-125-BeCu-2-S-L-250 SOLD 【4 探針プローブヘッド （旧型）】 ・JS-TC-100-100g　 単価¥40,000　残数1　厚い金属膜向け ・JS-TC-100-200g 　単価¥40,000　残数2　厚い金属膜向け ・JS-TC-600-.635　 単価¥40,000　残数1　　ITO向け ・JS-TC-600-200g　 単価¥40,000　残数2　　ITO向け ・JS-TC-600-100g　 単価¥40,000　残数5　　ITO向け ・JS-TC-400-.635-100g　単価¥40,000　残数3　薄膜向け 【精密プローブ針】

Home Products About Us SEMICON Japan 日本語サイト Company Profile Contact Please feel free to contact us for technical consultation, model selection, specifications etc. Phone: +81-3-3684-2548 / E-Mail: sales@nps-i.co.jp Outline Enlarged View (Google Maps) 5 minutes walk from JR Kameido Station 15 minutes walk from Toei Shinjuku LIne Nishi-Ojima Station Business items (main handled products) 1. 4-point probes and related devices for resistivity measuring instruments such as semiconductors and thin film layers 2. Sheet resistivity measuring instrument for semiconductor, liquid crystal thin film 3. High-performance probe for characterization of semiconductor IC (ULSI, VLSI, etc.) 4. Measurement probe and measurement device for microwave 5. Slide products for measurement, experimental, manual and electric linear/rotating type 6. Probe needle, scrape point 7. Laser interferometer system Management policy We select high-tech equipments and materials indispensable for the advancement of industrial technology in our country widely from domestic and overseas, and provide customers those equipments and information. In addition, we listen to customers' opinions and requests to contribute to the development of industry. As a partner, we carefully see the world trend, so that we help our customers' business more efficiently and achieve cost cutting. We promote consistent management with the motto "We will deliver better products at a lower price with an earlier delivery date". We define our value as the contribution to the development of our customers. President Hayato Nakamura

MTF - 100 and GT - 1100 are compact and simple test stands that can measure microwave substrates. You can use the coaxial type RF probe and the optional DC probes.  Since it is easy to carry, you can do measurement work at any measurement location. Both are  required lab systems which have the versatility as test fixtu Home Products About Us SEMICON Japan 日本語サイト Product list 　>　Semiconductors and Electronic Materials 　>　Jig tool for Microwave Testing Jig tool for Microwave Testing Microwave Measurement MTF - 100 and GT - 1100 are compact and simple test stands that can measure microwave substrates. You can use the coaxial type RF probe and the optional DC probes. Since it is easy to carry, you can do measurement work at any measurement location. Both are required lab systems which have the versatility as test fixtures. 【Related products】Picoprobe for I.C ・ Picoprobe for Microwave ■ Simple test stand MTF-100 The MTF-100 series is a test jig for evaluating characteristics by fixing and mounting small circuit boards and parts with microwave transmission lines. It is designed to be small but high precision and strong structure, and microwave evaluation test with low loss microwave probe set to 2 ports can be performed. Moreover, it is a small space design and you can carry around, and you use it anywhere. Probe used for the MTF-100 series select the pitch between the signal and the ground in the range of 50 microns to 2540 microns in order to correspond to the micro - electrode part. You are able to have a test of the frequency band up to 67 GHz by system up of the network analyzer. MTF-100.pdf GT-1100 (4 "compatible) GT-1100.pdf MODEL GT-1100 is a table-size standard test table which equips a low-loss microwave probe for measuring electrical characteristics of transmission circuit components in the microwave range (dc - 40 GHz) and a vacuum chuck that can fine - position the sample. You can conduct a measurement (50 - 110GHz) with optional probes. Because the MODEL GT-1100 is set with high-performance accessories such as probes required for measurement, it is excellent in cost performance and is the optimum measurement system in the research and development field. ■ Test stand for waveguide probe (GT-3000) ■ Test stand for tuner (GT-1502) The GT-3000 and GT-1500 series are test beds designed for efficient measurement using waveguide probes. The connection between the waveguide probe (millimeter wave band) and the tuner equipment etc. can be done at the shortest position, and you can reduce the loss. Also, since you can move the probe and instrument at the same time, it is suitable for the measurement using a waveguide probe. Custom-made is also welcome.

Home Products About Us SEMICON Japan 日本語サイト We have participated in SEMICON Japan which is a comprehensive exhibition of semiconductor manufacturing and inspection equipment from the first time. We appriciate for our customers who have taken care of us for many years. We have also participated in an exhibision "Microwave Exhibition" speciallized in microwave technology. SEMICON JAPAN ■ SEMICON JAPAN 1977 The first meeting was held at Dome Hall of Harumi Exhibition Hall. Exhibitors at the time Astec Co., Ltd. / Advantest Corporation / Applied Materials Japan Co., Ltd. / Ando Electric Co., Ltd. / Westbond Company / SDC Semicon Technology Co., Ltd. / Kanematsu Device Co., Ltd. / Complete Electronics / Canon Sales Co., Ltd. / Saint-Gobain Norton Corporation / Shipley · Far East Co., Ltd. / Japan Speedfam Co., Ltd. / Dainichisei Corporation / Disco / Dainippon Screen Mfg. Co., Ltd. / Tempronics Corporation / Tokyo Electron Co., Ltd. / Japan AERA Co., Ltd. / Japan AD Inc. / Japanese SMS Co., Ltd. / Japan MKS Corporation / Japan Swagelok Corporation / Nippon Micronics Co., Ltd. / Nomura Micro Science Co., Ltd. / Hakuto Co., Ltd. / Hitachi Kokusai Electric / Hitachi High-Technologies Corporation / Fujimi Incorporated / Fluoroware · Valkar Japan Co., Ltd. ■ Latest appearance It is our booth at SEMICON JAPAN held at Tokyo Big Sight. Microwave Exhibition It is our booth at Microwave Exhibition held at Pacifico Yokohama.

We prepare material for capillary used as IC bonding tool. The material is tungsten carbide. We also accept custom made capillary production on request. We can also produce assemblies such as ceramic, nozzle using TC material, wire guide etc. It is also used for coating carbide nozzles and pickup tools. Home Products About Us SEMICON Japan 日本語サイト Product list 　>　Semiconductors and Electronic Materials 　>　Capillary Blank Capillary Blank Other Products We prepare material for capillary used as IC bonding tool. The material is tungsten carbide. We also accept custom made capillary production on request. We can also produce assemblies such as ceramic, nozzle using TC material, wire guide etc. It is also used for coating carbide nozzles and pickup tools. L = 12 mm Dia = 1.58 mm d 1 = 1.0 mm

Because the SS magnet is made of stainless steel, it is suitable for use in places where rust should not be generated. The detachment can be done easily with the ON / OF lever. Home Products About Us SEMICON Japan 日本語サイト Product list 　>　Positioning Precision Machinery 　>　SS Magnet SS Magnet Positioning Precision Machinery Because the SS magnet is made of stainless steel, it is suitable for use in places where rust should not be generated. The detachment can be done easily with the ON / OFF lever. SS Magnet.pdf

Since the SC series coaxial probe needle is terminated at the SMA connector, it can be used in a high frequency band. The tungsten needle terminal for the signal line is processed to 5μR and it is easy to attach the microscopic part. You can select the specification with the ground with an option. Home Products About Us SEMICON Japan 日本語サイト Product list 　>　Semiconductors and Electronic Materials 　>　50Ω Coaxial Probe 50Ω Coaxial Probe Post-Process of Semiconductors and Liquid Crystal (Inspection) Microwave Measurement Since the SC series coaxial probe needle is terminated at the SMA connector, it can be used in a high frequency band. The tungsten needle terminal for the signal line is processed to 5μR and it is easy to attach the microscopic part. You can select the specification with the ground with an option. 【Related products】Jig tool for Microwave Testing ・ Micro Positioner

Repair, Reconditioning, and Adjustment of Four-Point Probes Currently used 4-point probes can be repaired and adjusted for reuse. In addition, running costs can be reduced by replacing only consumables such as needles and guides. For details, please contact our sales department. Home Products About Us SEMICON Japan 日本語サイト 製品ラインナップ 　>　半導体・電子材料関連 　>　4探針プローブ 4-Point Probe Repair Pre-Process of Semiconductors and Liquid Crystal (Inspection) ■ Repair for 4-Point probe Repair, Reconditioning, and Adjustment of Four-Point Probes Currently used 4-point probes can be repaired and adjusted for reuse. In addition, running costs can be reduced by replacing only consumables such as needles and guides. For details, please contact our sales department. Repairable Probe Type NAPSON KLA Tencor MPP FELL Contact us

It is a micromotion positioning device that enables high precision positioning by micrometer driven type. A dedicated adapter is installed so that Picoprobe design and manufactured by  GGB Industries,Inc(US) can be installed. Home Products About Us SEMICON Japan 日本語サイト Product list 　>　Semiconductors and Electronic Materials 　>　Micro Positioner Micro Positioner Post-Process of Semiconductors and Liquid Crystal (Inspection) It is a micromotion positioning device that enables high precision positioning by micrometer driven type. A dedicated adapter is installed so that Picoprobe d esign and manufactured by GGB Industries,Inc (US) can be installed. The MODEL 800 series is a high performance micro positioner specifically designed for pico probe. High precision probing is possible with the positioning mechanism of utility model and 3-axis integral micro positioning system. 【Related products】Picoprobe for IC ・ Picoprobe for Microwave ■ Model 800M Series ■ Model 800V Series MODEL800.pdf

Home Products About Us SEMICON Japan 日本語サイト Product list 　>　Semiconductors and Electronic Materials 　>　Function comparison ■ Function comparison table of picoprobles for microwave Probe for Microwave Calibration substrate（Probe for Microwave） Calibration substrate（For >110GHz） Calibration substrate（For dual type probe）

ピコプローブ（Picoprobe）は電気容量値を示す単位ピコファラッド（ｐＦ）のピコ（ｐｉｃｏ）と、オシロスコープで使用するプローブ（Probe）との造語で、米国GGB Industries, Inc.の登録商標です。既に半導体回路設計のフィールドにおいては高性能低入力容量（ＦＥＴ）プローブ＝ピコプローブとして認知いただいております。 ​ ピコプローブとは 　ピコプローブ(Picoprobe)は、電気容量値を示す単位「ピコファラッド(pF)」の「ピコ(pico)」 と、オシロスコープで使用する「プローブ(Probe)」 との造語で、米国「GGB Industries, Inc.」 の登録商標です。既に半導体回路設計のフィールドにおいては高性能低入力容量（FET）プローブ＝ピコプローブとして認知いただいております。 　ピコプローブは、IC、CMOS、また、液晶用省電力回路等の内部電圧計測のための高性能FETプローブ（アクティブプローブ）です。 ピコプローブの持つ超低入力容量と高入力抵抗は、高インピーダンス回路に対して低負荷でのプロービングが実現でき、被測定回路に与える影響を最小限にし、波形を忠実に再現することができます。 しかしながら、一般のFETプローブ以上にシビアな性能のため、特殊性を熟知した専門技術者だけが取扱える、プロフェッショナル用のツールです。 　ピコプローブは1970年代、当時の米国ベル研究所でICの設計に携わっていた技術者ボール氏が、自己の専用ツールとして設計製作した電圧測定用プローブをベースに製品開発されたもの です。1980年にGGB Industries, Inc.が設立され、ピコプローブの商品名で世界中に発売が開始されて以来、現在に至るまで40年以上のロングセラー商品となっております。 　当時は入力容量が最小でも1pFという値のプローブしか世の中に存在しておらず、MOSの動作検証テストやIC故障解析で使用するにはかなりの支障がありました。しかし、入力容量0.02pFという驚異的な性能を持つピコプローブの出現によって、IC技術革新に大きく貢献することができました。 　その後、1988年に開発されたGGB社独自の構造を持つマイクロ波用ピコプローブ（米国特許取得）とともに、ピコプローブは電子回路テスト用高性能プローブの代名詞となり、世界的な標準器具としてプロの技術者に広くご使用いただいております。 　クラフトマンシップを大切にするGGBの技術屋が製作するピコプローブ。こだわりを持つプロの技術者におすすめいたします。 > GGB社のホームページへ (ピコプローブは米国GGB Industries, Inc.の登録商標です。) 中村＠NPS

It is the contact probe which is mounted on an IC test handler and can be used for such as SOP, SSOP in addition to 0.65 mm, 1.27 mm, 2.54 mm pitch and etc. Home Products About Us SEMICON Japan 日本語サイト Product list 　>　Semiconductors and Electronic Materials 　>　IC Contact Probe IC Contact Probe Post-Process of Semiconductors and Liquid Crystal (Inspection) It is the contact probe which is mounted on an IC test handler and can be used for such as SOP, SSOP in addition to 0.65 mm, 1.27 mm, 2.54 mm pitch and etc. It is durable and can be used at low running cost. Electrode (needle) material is gold plated on beryllium copper. Besides, it is possible to manufacture with palladium alloy and tungsten.