IC Contact Probe
It is the contact probe which is mounted on an IC test handler and can be used for such as SOP, SSOP in addition to 0.65 mm, 1.27 mm, 2.54 mm pitch and etc. It is durable and can be used at low running cost.
Electrode (needle) material is gold plated on beryllium copper. Besides, it is possible to manufacture with palladium alloy and tungsten.